| PART |
Description |
Maker |
| MAX9951DCCB MAX9951 |
Dual Per-Pin Parametric Measurement Units
|
MAXIM - Dallas Semiconductor
Maxim Integrated Products
|
| MAX9952DCCB MAX9952DCCBT MAX9952DCCB-D MAX9952DCCB |
Dual Per-Pin Parametric Measurement Units
|
Maxim Integrated Products
|
| E4287AHFT |
Dual Channel Per-Pin Parametric Measurement Unit
|
Semtech Corporation
|
| MAX9949 |
(MAX9949 / MAX9950) Dual Per-Pin Parametric Measurement Units
|
Maxim Integrated Products
|
| AT49BV002A AT49BV002AN AT49V002ANT AT49V002AT AT49 |
AT49BV002A(N)(T) [Updated 8/03. 19 Pages] 256K x 8 (2M bit). 2.7-Volt Read and 2.7-Vold Write. Top or Bottom Boot Parametric Block Flash
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Top Boot Parametric Block Flash
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Bottom Boot Parametric Block Flash
|
Atmel
|
| EVAL-AD5522EBDZ EVAL-AD5522EBUZ |
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
|
Analog Devices
|
| ML9XX1104 ML925B11F |
Notice : Some parametric limits are subject to change InGaAsP DFB LASER DIODES
|
Mitsubishi Electric Semiconductor
Mitsubishi Electric Semicon...
|
| AT49F002 AT49F002N-55TC |
x8 Flash EEPROM
From old datasheet system
256K x 8 (2M bit), 5-Volt-Only, Top or Bottom Boot Parametric Block Flash
|
Atmel Corp
|
| 888-5-R330J 887 887-1-R220F 887-1-R220G 887-1-R220 |
Model 888,887 18&20 pin Dual In-Line Thick Film Resistor Network
Model 888,887 18&20 pin Dual In-Line Thick Film Resistor Network 模型888887 18
4 Megabit (512 K x 8-Bit) CMOS 3.0 Volt-only, Boot Sector 32-Pin Flash Memory 4兆位12亩8位）.0伏的CMOS只，引导扇区32引脚闪存
|
List of Unclassifed Man...
Electronic Theatre Controls, Inc.
List of Unclassifed Manufacturers
ETC[ETC]
|
| 0702871038 |
2.54mm (.100) Pitch C-Grid? Header, Breakaway, Dual Row, Vertical, with Retention Pin, 80 Circuits, 6.10mm (.240) Mating Pin Length, Tin (Sn) Plating
|
Molex Electronics Ltd.
|
| DBCPHC3702AG1 DBCPHC3703AG1 DBCPHC3704AG1 DBCPHC37 |
PIN HEADERS DUAL BODY DUAL ROW - 2.0MM
|
Dubilier
|
| 1N750A |
Online technical data and parametric search
|
Central Semiconductor C...
|
